发明名称 CHARGED PARTICLE BEAM DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a charged particle beam device such as an electron scanning microscope to construct a three-dimensional image (stereoscopic image) from an image obtained by the beam inclination of a right/left disparity angle. SOLUTION: A charged particle beam incident to a sample is set to be an inclined angle equivalent to the right/left disparity angle. In this constitution, a control part to carry out the beam inclination scanning of the disparity angle by one line unit is installed, scanning is carried out by a right/left inclination beam on the sample, and the image is obtained. Moreover, by combining a synthetically canceling means by an optical system of a multistage lens utilizing a swing-back action of the lens, and disparity beam control, the three-dimensional image in which the deterioration of a resolution is suppressed is displayed in an actual time (real time). COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2010009907(A) 申请公布日期 2010.01.14
申请号 JP20080167023 申请日期 2008.06.26
申请人 HITACHI HIGH-TECHNOLOGIES CORP 发明人 ITO MASUHIRO;KATANE JUNICHI;KAWAMATA SHIGERU;TOMITA SHINICHI
分类号 H01J37/147;H01J37/153;H01J37/18 主分类号 H01J37/147
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