发明名称 CMOS image sensor and method for fabricating the same
摘要 A CMOS image sensor and a method of fabricating the same are provided. The CMOS image sensor includes: a semiconductor substrate of a first conductivity type having a photodiode region and a transistor region defined therein; a gate electrode formed above the transistor region of the semiconductor substrate with a gate insulating layer interposed therebetween; a first impurity region formed of the first conductivity type in the semiconductor substrate below the gate electrode and having a higher concentration of first conductivity type ions than the semiconductor substrate; and a second impurity region formed of a second conductivity type in the photodiode region of the semiconductor substrate.
申请公布号 US7645652(B2) 申请公布日期 2010.01.12
申请号 US20060507346 申请日期 2006.08.21
申请人 DONGBU ELECTRONICS CO., LTD. 发明人 HYUK LIM KEUN
分类号 H01L21/00;H01L21/331;H01L21/338 主分类号 H01L21/00
代理机构 代理人
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