| 摘要 |
A semiconductor memory device includes a memory cell array, word line, row decoder, bit line, sense amplifier, dummy cell array, dummy bit line, sense amplifier activation circuit, and signal interconnection. The word line is connected to memory cells arrayed in the column direction. The row decoder is connected to the word line. The bit line is connected to memory cells arrayed in the row direction. The sense amplifier is connected to the bit line. Dummy cells are arrayed in the row direction between the row decoder and the memory cell array. The dummy bit line is connected to the dummy cells. The sense amplifier activation circuit transmits a sense start signal for setting a sense start timing to the sense amplifier through the signal interconnection. In this arrangement, the signal delay of the word line is set to be equal to that of the signal interconnection.
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