发明名称 PLASMA PROCESSING METHOD AND PLASMA PROCESSING APPARATUS
摘要 The invention provides a plasma processing apparatus capable of setting the temperature of the plasma processing chamber accurately to a specific state, and to perform highly accurate plasma processing while maintaining a constant plasma processing property. The plasma processing apparatus for subjecting a sample w to be processed to plasma processing within a plasma processing chamber 1 comprises a database 25 for correlating and storing the inner temperature of the plasma processing chamber 1 and the plasma generating condition, a model expression storage unit 26 for storing the correlating equation of the inner temperature of the plasma processing chamber 1 and the plasma generating condition from the database 25, and a computing machine 21 having an operation unit 24 for creating the correlation equation and the optimum plasma generating condition, further having a process monitor 31 for monitoring the condition of plasma processing, wherein the value output by the process monitor and the temperature of the plasma processing chamber are correlated and stored in the database 25, and the computing machine 21 computes a plasma processing condition capable of realizing a substantially constant plasma processing chamber temperature, based on which the plasma processing chamber performs plasma processing.
申请公布号 US2010004795(A1) 申请公布日期 2010.01.07
申请号 US20080199838 申请日期 2008.08.28
申请人 HITACHI TECHNOLOGIES CORPORATION 发明人 IWAKOSHI TAKEHISA;SAITO GO
分类号 G05D23/00;G06F17/10 主分类号 G05D23/00
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