| 摘要 |
<P>PROBLEM TO BE SOLVED: To reduce the load of an imaging device inspection step and an imaging device application adjustment step to reduce the cost even when the number of kinds of driving modes of a CCD type solid-state imaging device is increased. Ž<P>SOLUTION: In a pixel defect correction method for an imaging apparatus having the CCD type solid-state imaging device performing all pixel driving of individually reading out detection signals from all pixels and pixel addition driving of adding detection signals of a plurality of pixels to read out the detection signals, the same vertical transfer stand-by electrodes V1 to V4 are used for both pixel addition driving and all pixel driving of the solid-state imaging device, and pixel defect of picked-up image data obtained by pixel addition driving is corrected by using the same pixel defect appearance position information as pixel defect correction of picked-up image data obtained by all pixel driving. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
|
