发明名称 TIME INTERVAL ANALYZER AND MEASURING METHOD THEREOF
摘要 <P>PROBLEM TO BE SOLVED: To solve the problem that much measuring time is required in conventional time interval analyzers because division processes are done more than the number of measuring samples to obtain a result of measurement. Ž<P>SOLUTION: The time interval analyzer includes a phase comparator 11 determining that a delay amount of the measured signal has is either positive delaying or negative delaying to a characteristic value and an operational circuit 13 outputting the result of division process consisting of the number of measured signal with positive delaying and the number of measured signal with negative delaying, as a result of measurement. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
申请公布号 JP2010002368(A) 申请公布日期 2010.01.07
申请号 JP20080162983 申请日期 2008.06.23
申请人 NEC ELECTRONICS CORP 发明人 KITANO TOSHIAKI
分类号 G01R29/02;H04L25/02 主分类号 G01R29/02
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