| 摘要 |
A picker unit for a module IC test handler is provided to reduce a process standby time by simply adjusting a distance between gripper arms corresponding to a module IC. A picker unit includes a frame(110), a pair of grippers(130,160), and a pair of gripper arms(150,180). The frame is arranged in a handler to be moved in horizontal and vertical directions. The grippers are arranged to be moved in a horizontal direction by a predetermined distance on the frame. The gripper arms are arranged on respective grippers and selectively fix the module IC between them. A distance between the gripper arms is adjusted according to a size of the module IC to be fixed on the handler. |
