发明名称 |
PHOTOSENSITIVE COMPOSITION, PATTERN FORMING METHOD USING IT, AND METHOD OF MANUFACTURING SEMICONDUCTOR ELEMENT |
摘要 |
<P>PROBLEM TO BE SOLVED: To form a resist pattern having excellent resolution and sensitivity. <P>SOLUTION: The photosensitive composition to which a high-energy beam having a wavelength in the band of 1-300 nm is irradiated includes a binder resin, and a photoelectron absorbing agent to be reacted with photoelectrons emitted from the binder resin absorbing the high-energy beam when the high-energy beam is irradiated onto the binder resin. <P>COPYRIGHT: (C)2010,JPO&INPIT |
申请公布号 |
JP2010002538(A) |
申请公布日期 |
2010.01.07 |
申请号 |
JP20080160023 |
申请日期 |
2008.06.19 |
申请人 |
NEC ELECTRONICS CORP |
发明人 |
CHOKAI MINORU;ITANI TOSHIRO |
分类号 |
G03F7/004;C08F212/14;G03F7/039;H01L21/027 |
主分类号 |
G03F7/004 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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