发明名称 PHOTOSENSITIVE COMPOSITION, PATTERN FORMING METHOD USING IT, AND METHOD OF MANUFACTURING SEMICONDUCTOR ELEMENT
摘要 <P>PROBLEM TO BE SOLVED: To form a resist pattern having excellent resolution and sensitivity. <P>SOLUTION: The photosensitive composition to which a high-energy beam having a wavelength in the band of 1-300 nm is irradiated includes a binder resin, and a photoelectron absorbing agent to be reacted with photoelectrons emitted from the binder resin absorbing the high-energy beam when the high-energy beam is irradiated onto the binder resin. <P>COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2010002538(A) 申请公布日期 2010.01.07
申请号 JP20080160023 申请日期 2008.06.19
申请人 NEC ELECTRONICS CORP 发明人 CHOKAI MINORU;ITANI TOSHIRO
分类号 G03F7/004;C08F212/14;G03F7/039;H01L21/027 主分类号 G03F7/004
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