| 摘要 |
<p>The present invention provides a photovoltaic devices inspection apparatus and method of determining defects in photovoltaic devices that uses electroluminescence. The apparatus and method can determine not only the quality of the photovoltaic devices from the state of electroluminescence but also the quality that photovoltaic devices have the possibility of becoming defective in the future. A constant electric current is applied to the photovoltaic devices to cause electroluminescence of the photovoltaic devices (S7), the light emitted from each photovoltaic cell of the photovoltaic devices is photographed cell by cell (S10), and the photographed image of the photovoltaic cell is divided into bright region and dark region by using a threshold value and displayed as an enhanced image by binarization. Each defect of the photovoltaic cell is classified according to defect types, analyzed by comparing a shape of the dark region with the defect types(S50). The existence of the defect is determined so that the determination whether passed or not of photovoltaic devices is performed. Enhanced images of regions deemed to be defective problem regions are displayed for visual inspection (S16).</p> |
