发明名称 UNIT FOR TESTING TWIST OF ELECTRON PARTS AND APPARATUS FOR ASSEMBLING ELECTRON PARTS AND METHOD FOR CALCULATING ROTATION DEGREE OF ELECTRON PARTS
摘要 PURPOSE: A unit for testing twist of electron parts and an apparatus for assembling electron parts and a method for calculating rotation degree of electron parts are provided to calculate the rotation angle of an electronic component by determining most frequent between solder balls as a rotation angle. CONSTITUTION: A plurality of solder balls are formed at a place for a ball of the electronic component. An image pick-up part(510) obtains image information of the place to the ball of the electronic component. A control module(520) comprises a setting unit(521), an operation unit(522), and a storing unit(523). The setting unit defines a check region within the place for the ball. The operation unit decides the most frequency among angles between the solder balls within the check region. The storing unit stores the determined rotation angle.
申请公布号 KR20100001760(A) 申请公布日期 2010.01.06
申请号 KR20080061802 申请日期 2008.06.27
申请人 SAMSUNG TECHWIN CO., LTD. 发明人 PARK, YUN WON;KANG, SUN JEONG
分类号 H01L23/544;H01L21/66 主分类号 H01L23/544
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