发明名称 METHOD FOR FABRICATING NON-VOLATILE MEMORY DEVICE BY USING WAFER BONDING PROCESS
摘要 <p>PURPOSE: A method for manufacturing a nonvolatile memory device is provided to integrate a lot of memory cells in a limited area on a wafer using a wafer bonding. CONSTITUTION: A first gate stack(110) for a first NAND string is formed on a first semiconductor substrate(100). A first insulation layer(130) is formed to cover the first gate stack. An ion implantation layer is formed in the second semiconductor substrate. The second semiconductor substrate is stacked on the first insulation layer. The first and second semiconductor substrates are bonded with the wafer bonding. The second semiconductor substrate under the ion implantation layer is set as a semiconductor layer(201). The surface roughness of the semiconductor layer is reduced by removing an oxide layer. A second gate stack(250) for a second NAND string is formed on the semiconductor layer.</p>
申请公布号 KR20090133001(A) 申请公布日期 2009.12.31
申请号 KR20080059238 申请日期 2008.06.23
申请人 HYNIX SEMICONDUCTOR INC. 发明人 AHN, TAE HANG
分类号 H01L21/8247;H01L27/115 主分类号 H01L21/8247
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