COHERENT NONLINEAR MICROSCOPY SYSTEM AND METHOD WITH VARIATION OF THE FOCAL VOLUME IN ORDER TO PROBE THE NANOSTRUCTURE OF ORGANIZED MATERIALS

摘要

The invention relates to a method for the dimensional characterization of a structured material, in which method : an excitation laser beam suitable for coherent nonlinear microscopy is generated, this excitation laser beam being focused in a focal volume within the structured material; signals emitted by the structured material are detected; a plurality of emission patterns, each corresponding to one particular shape of the focal volume, is produced, the particular shapes being obtained for various non-Gaussian spatial profiles of the excitation laser beam wavefront; and on the basis of the emission patterns thus produced, dimensional characteristics of said structured material are deduced therefrom.