| 摘要 |
Defects within structures formed by deposition processes can be relatively expensive, particularly as previously non-destructive testing was performed only once the component had been formed. By in-situ continuous or intermittent sequential non-destructive testing, early notice of defects can be provided. Such early notice may allow rejection of the part-formed component, correction of the errors causing the defect, or through an auto-correction process adjustment of the deposition devices or otherwise to improve component quality. Generally, deposition processes provide for provision of a layer of material (3) which is consolidated in order to form an object component through use of a consolidation device (5). By providing a non-destructive testing device (8) which either continuously inspects the layers (3) of consolidated component or sequentially inspects the object component (6), it is possible as indicated to provide an early identification of defect problems within a formed object component (6). |
