发明名称 SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
摘要 <p>A method for manufacturing a semiconductor device has a step of forming insulating films (38, 40, 42) made of silicon compound-based insulating material on a substrate (10), a step of forming an opening (48) on the insulating films (38, 40, 42), a step of forming a barrier layer (50) made of crystalline SiC on the inner surface of the opening (48) by irradiating the inner surface with active energy rays in an atmosphere containing hydrocarbon-based gas, and a step of forming a wiring structure (52) made of copper within the opening (48) in which the barrier layer (50) is formed.</p>
申请公布号 WO2009153857(A1) 申请公布日期 2009.12.23
申请号 WO2008JP61023 申请日期 2008.06.17
申请人 FUJITSU LIMITED;OZAKI, SHIROU;NAKATA, YOSHIHIRO;KOBAYASHI, YASUSHI;MINOURA, YUICHI 发明人 OZAKI, SHIROU;NAKATA, YOSHIHIRO;KOBAYASHI, YASUSHI;MINOURA, YUICHI
分类号 H01L21/768;H01L21/316;H01L23/522 主分类号 H01L21/768
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