TEMPERATURE CONTROL WITHIN STORAGE DEVICE TESTING SYSTEMS

摘要

A storage device testing system cooling circuit (20) includes a plurality of test racks (100). Each of the test racks include a test slot compartment (700) and a test electronics compartment (800). Each of the test slot compartments includes multiple test slots (500, 500a, 500b, 540), and one or more cooling conduits (710) configured to convey a cooling liquid toward the test slots. Each of the test electronics compartments includes test electronics (160) configured to communicate with the test slots for executing a test algorithm, and a heat exchanger (810) in fluid communication with the one or more cooling conduits. The heat exchanger is configured to cool an air flow directed toward the test electronics.