发明名称 ANALYZER
摘要 <P>PROBLEM TO BE SOLVED: To provide an analyzer for analyzing a light scattering characteristics, and reducing the time required for analysis. Ž<P>SOLUTION: The analyzer is provided, and includes: a plurality of light sources disposed around a sample; an optical modulation section for intensity-modulating lights irradiated by a portion or all of a plurality of the light sources with sinusoidal waves at different frequencies, and irradiating the sample with it; a detector for detecting the scattered light generated by irradiating the sample with a plurality of the intensity-modulated lights; and a frequency analysis section for frequency-analyzing the intensity waveforms of the scattered light. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
申请公布号 JP2009294148(A) 申请公布日期 2009.12.17
申请号 JP20080149622 申请日期 2008.06.06
申请人 TOKAI UNIV 发明人 OISHI TOMOHIKO;TANAKA AKIHIKO
分类号 G01N21/49 主分类号 G01N21/49
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