摘要 |
<P>PROBLEM TO BE SOLVED: To provide an analyzer for analyzing a light scattering characteristics, and reducing the time required for analysis. Ž<P>SOLUTION: The analyzer is provided, and includes: a plurality of light sources disposed around a sample; an optical modulation section for intensity-modulating lights irradiated by a portion or all of a plurality of the light sources with sinusoidal waves at different frequencies, and irradiating the sample with it; a detector for detecting the scattered light generated by irradiating the sample with a plurality of the intensity-modulated lights; and a frequency analysis section for frequency-analyzing the intensity waveforms of the scattered light. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
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