发明名称 |
THE METHOD FOR FABRICATING NON-VOLATILE MEMORY DEVICE IMPROVING COUPLING RATIO |
摘要 |
<p>PURPOSE: A method for manufacturing a nonvolatile memory device capable of improving coupling ratio is provided to perform etching process easily by reducing aspect ratio, by reducing step coverage during etching process to form a contact hole. CONSTITUTION: An insulation layer is formed on a semiconductor substrate(100). An insulation layer pattern(105b) and a tunneling layer pattern(105a) thinner than the insulation layer pattern are formed by etching the insulation layer selectively. The tunneling layer pattern is exposed in a fixed width from both sidewalls of the insulation layer pattern on the tunneling layer pattern. A dielectric layer pattern(145) is formed on the top, the sidewall of the floating gate pattern and on the insulation layer pattern. A conductive film is formed on the dielectric film pattern. The dielectric film pattern is formed with a thickness of 20 to 40 angstorm.</p> |
申请公布号 |
KR20090125633(A) |
申请公布日期 |
2009.12.07 |
申请号 |
KR20080051840 |
申请日期 |
2008.06.02 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
KIM, YONG TOP;PARK, KI SEON;HWANG, SUN HWAN;LEE, KI HONG;AN, JUNG HYUN;KIM, CHANG KIL |
分类号 |
H01L27/115 |
主分类号 |
H01L27/115 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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