发明名称 METHOD AND APPARATUS FOR TESTING HIGH CAPACITY/HIGH BANDWIDTH MEMORY DEVICES
摘要 A plurality of stacked memory device die and a logic circuit are connected to each other through a plurality of conductors. The stacked memory device die are arranged in a plurality of vaults. The logic circuit die serves as a memory interface device to a memory access device, such as a processor. The logic circuit die includes a plurality of link interfaces and downstream targets for transmitting received data to the vaults. The logic circuit die includes a packet builder and broadcaster configured to receive command, address and data signals over separate interfaces from a conventional tester, format the signals into a packet and broadcast the signals to a plurality of vaults.
申请公布号 US2009300444(A1) 申请公布日期 2009.12.03
申请号 US20080132332 申请日期 2008.06.03
申请人 MICRON TECHNOLOGY, INC. 发明人 JEDDELOH JOSEPH M.
分类号 G11C29/04;G06F11/26 主分类号 G11C29/04
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