发明名称 ISOLATION TRENCH INTERSECTION STRUCTURE WITH REDUCED GAP WIDTH
摘要 The invention relates to isolation trenches having a high aspect ratio for trench-insulated smart power technologies in Silicon On Insulator (SOI) silicon wafers. The specific geometric layout of the intersections and junctions of the isolation trenches allows error rate reduction and simplification of manufacture.
申请公布号 US2009294893(A1) 申请公布日期 2009.12.03
申请号 US20060096580 申请日期 2006.12.08
申请人 X-FAB SEMICONDUCTOR FOUNDRIES AG 发明人 LERNER RALF;ECKHOLDT UWE
分类号 H01L29/06 主分类号 H01L29/06
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