发明名称 TEST PATTERN GENERATION METHOD OF SEMICONDUCTOR INTEGRATED CIRCUIT, TEST PATTERN GENERATOR OF SEMICONDUCTOR INTEGRATED CIRCUIT, CONTROL PROGRAM, READABLE RECORDING MEDIUM
摘要 PROBLEM TO BE SOLVED: To surely apply a predetermined voltage between terminals in all transistors for composing a cell during a predetermined time, and improve a transistor activation rate without inspecting a logical value e.g. a toggle rate such as a wiring voltage between the cells. SOLUTION: A CPU 1 uses a transistor activity condition table for indicating the existence of the activation of the transistor corresponding to a voltage between the terminals of the transistors within the cell and a voltage at an input/output terminal per cell type of the cell for constituting a semiconductor integrated circuit, selects terminals of the transistors between which a voltage of a predetermined value or higher is applied, assigns a cell state as an input value to the cell having the transistor so as to apply the predetermined voltage between the terminals of the transistor, and generates a test pattern as an input sequence to an external input terminal of the cell so as to achieve the cell state based on a test pattern generation program as a control program of a HDD 2. COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2009281948(A) 申请公布日期 2009.12.03
申请号 JP20080136095 申请日期 2008.05.23
申请人 SHARP CORP 发明人 KUCHII TOSHIMASA
分类号 G01R31/3183 主分类号 G01R31/3183
代理机构 代理人
主权项
地址
您可能感兴趣的专利