| 摘要 |
PURPOSE: An electric signal interfacing assembly and an electric test device including the same are provided to sufficiently prevent damage in a manufacturing process of an electric test device by preventing pollution of a via-contact wiring. CONSTITUTION: A via wiring(31) interfaces an electric signal in between a subject for testing an electrical state and a test for determining an electrical state of the subject. Via-contact wirings(33,35,37,39) are directly connected to the via wiring, and provide resistance to an electric signal path interfaced through the via wiring. A surface wiring(43,45,47,49) sufficiently covers the via-contact wiring, and interfaces an electric signal in between the via wiring and a probe(53,55,57,59) contacted in the subject at an electrical test process. |
