发明名称 METHOD FOR FABRICATING SEMICONDUCTOR DEVICE
摘要 <p>PURPOSE: A method for fabricating semiconductor device is provided to prevent the excessive diffusion in the thermal process and to prevent the punch through. CONSTITUTION: The silicon substrate(200), and the laminating structure of the silicon layer(210a) and buried insulating layer are formed. The gate pattern(220) is formed on the silicon layer. The spacer(225) is formed in the gate pattern side wall. The silicon layer exposing between the gate patterns is etched to expose the buried insulating layer. The polysilicon layer is formed in the whole upper unit including the etched silicon layer. The thermal process is formed on the silicon layer to form the source/drain region.</p>
申请公布号 KR20090123696(A) 申请公布日期 2009.12.02
申请号 KR20080049894 申请日期 2008.05.28
申请人 HYNIX SEMICONDUCTOR INC. 发明人 KIM, JOONG SIK;CHUNG, SUNG WOONG
分类号 H01L29/78;H01L21/336 主分类号 H01L29/78
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