Method for self-monitoring the breakdown in semiconductor components and semiconductor component adapted thereto

摘要

The method involves integrating a photosensitive electronic component in an environment of a p-n-junction being monitored in the semiconductor component. Optical radiation is detected, which is emitted by p-n-junction in the latch of the breakout. A voltage applied on the p-n-junction or a current guided over the p-n-junction is regulated depending on the detected radiation. An independent claim is also included for a semiconductor component with a p-n-junction, a regulation unit and photosensitive electronic component.