发明名称 Charged particle beam apparatus, method for controlling charged particle, and frequency adjustment apparatus
摘要 An ion gun 11 supplies an Ar gas into a main body 111 from a gas inlet 114, causes DC hot cathode discharge between a filament 113 and an anode 112 to generate Ar plasma. Next, a voltage gradient is applied to separated accelerator grids 116a, 116b having a bi-separated configuration in an ion ejecting direction. The each potential of the separated accelerator grids 116a, 116b is independently controlled by independently setting accelerator control switches 121a, 121b on or off to change the potential of that of the separated accelerator grids 116a, 116b which corresponds to an ion beam to be disabled.
申请公布号 US7626180(B2) 申请公布日期 2009.12.01
申请号 US20070946170 申请日期 2007.11.28
申请人 SHOWA SHINKU CO., LTD. 发明人 OSADA YUSUKE;SHIONO TADAHISA;YABE YUTAKA;ITO MAKOTO
分类号 H01J27/00 主分类号 H01J27/00
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