发明名称 Apparatus for testing a device with a high frequency signal
摘要 The present invention provides an apparatus for testing a device with a high frequency signal, such as an RF signal. The apparatus delivers a high frequency signal directly to a loadboard with a coaxial cable. The coaxial cable can deliver the signal to a location at or near the device on the loadboard. The cable can connect to the loadboard through a threaded connection. The other end of the cable can connect to a testing module or another cable. The apparatus can further comprise a section or housing between the circuit board and the testing module to provide support for the cables and their respective connections. The apparatus can further provide connections for both high frequency testing and low frequency testing.
申请公布号 US7627445(B2) 申请公布日期 2009.12.01
申请号 US20040993750 申请日期 2004.11.19
申请人 ADVANTEST CORPORATION 发明人 ITO YOSHIMASA
分类号 G01R31/00;G01R31/28;H01R9/05 主分类号 G01R31/00
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