发明名称 Temperature-controlled metallic dry-fill process
摘要 A method for performing ionized physical vapor deposition (iPVD) is described, whereby the substrate temperature can be rapidly changed to control a metal deposition process and increase the quality of the metal deposited. In one embodiment, a copper deposition process can be performed.
申请公布号 US7618888(B2) 申请公布日期 2009.11.17
申请号 US20060389511 申请日期 2006.03.24
申请人 TOKYO ELECTRON LIMITED 发明人 CERIO, JR. FRANK M.
分类号 H01L21/4763 主分类号 H01L21/4763
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