发明名称 Laser crystallization method suppressing propagation of cracks forming a display device
摘要 A method of irradiating at least a part of a semiconductor film on the substrate with a CW or pseudo-CW laser beam so as to grow crystals laterally. A region over the semiconductor film having Si as a chief component is provided with a pixel region, a gate line driving circuit region and a signal line driving circuit region for driving pixels, and a terminal region where connection terminals will be formed. The region not irradiated with the CW laser beam is provided in a peripheral portion of each semiconductor device corresponding to the position where the glass substrate will be cut. Due to this means, it is possible to suppress occurrence of a failure caused by propagation of cracks when the substrate is cut.
申请公布号 US7619251(B2) 申请公布日期 2009.11.17
申请号 US20060440180 申请日期 2006.05.25
申请人 HITACHI DISPLAYS, LTD. 发明人 SATO TAKESHI;KAMO TAKAHIRO;NODA TAKESHI
分类号 H01L29/04;H01L21/36;H01L21/84;H01L31/036 主分类号 H01L29/04
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