发明名称 SPECIMEN TREATING SYSTEM
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a specimen treating system can shorten the waste time of the work of an operator to enhance the efficiency of work. <P>SOLUTION: The specimen treating system includes a specimen charging unit 11, pretreatment units 12-16 for setting the specimen charged in the specimen charging unit 11 to a mode suitable for the analysis in an autoanalyzer 40 or off-line analyzer, a feed line 19 for feeding the specimen, of which the pretreatment is completed in the pretreatment units, to the autoanalyzer, a specimen housing unit 17 for housing an empty rack, a data processing part 30 for forming an indication signal for indicating reporting operation with respect to the emergent specimen analyzed in the off-line analyzer on the basis of the signal from the specimen charging unit 11 input at least at the charging time of the specimen and the signals from the pretreatment units 12-16 input upon completion of pretreatment, and report means 31, 32 and 60 for reporting the charging of the emergent specimen and the completion of pretreatment at any time according to the indication signal from the data processing part. <P>COPYRIGHT: (C)2010,JPO&INPIT</p>
申请公布号 JP2009264884(A) 申请公布日期 2009.11.12
申请号 JP20080113867 申请日期 2008.04.24
申请人 HITACHI HIGH-TECHNOLOGIES CORP 发明人 SHISHIDO TAKAAKI;SUZUKI IWAO;YANO SHIGERU
分类号 G01N35/02 主分类号 G01N35/02
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