发明名称 |
METHOD OF PRODUCING GROUP 3 NITRIDE SUBSTRATE WAFERS AND GROUP 3 NITRIDE SUBSTRATE WAFERS |
摘要 |
Quality of one-surface planar processed group 3 nitride wafers depends upon a direction of pasting of wafers on a polishing plate. Low surface roughness and high yield are obtained by pasting a plurality of group 3 nitride as-grown wafers on a polishing plate with OFs or notches facing forward (f), backward (b) or inward (u) with thermoplastic wax having a thickness of 10�m or less, grinding the as-grown wafers, lapping the ground wafers, polishing the lapped wafers into mirror wafers with a bevel of a horizontal width of 200�m or less and a vertical depth of 100�m or less. |
申请公布号 |
HK1113859(A1) |
申请公布日期 |
2009.11.06 |
申请号 |
HK20080103775 |
申请日期 |
2008.04.03 |
申请人 |
SUMITOMO ELECTRIC INDUSTRIES, LTD. |
发明人 |
ISHIBASHI, KEIJI;IRIKURA, MASATO;NAKAHATA, SEIJI |
分类号 |
B24B37/30;C04B41/91;H01L;H01L21/304 |
主分类号 |
B24B37/30 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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