发明名称 METHOD OF PRODUCING GROUP 3 NITRIDE SUBSTRATE WAFERS AND GROUP 3 NITRIDE SUBSTRATE WAFERS
摘要 Quality of one-surface planar processed group 3 nitride wafers depends upon a direction of pasting of wafers on a polishing plate. Low surface roughness and high yield are obtained by pasting a plurality of group 3 nitride as-grown wafers on a polishing plate with OFs or notches facing forward (f), backward (b) or inward (u) with thermoplastic wax having a thickness of 10�m or less, grinding the as-grown wafers, lapping the ground wafers, polishing the lapped wafers into mirror wafers with a bevel of a horizontal width of 200�m or less and a vertical depth of 100�m or less.
申请公布号 HK1113859(A1) 申请公布日期 2009.11.06
申请号 HK20080103775 申请日期 2008.04.03
申请人 SUMITOMO ELECTRIC INDUSTRIES, LTD. 发明人 ISHIBASHI, KEIJI;IRIKURA, MASATO;NAKAHATA, SEIJI
分类号 B24B37/30;C04B41/91;H01L;H01L21/304 主分类号 B24B37/30
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