发明名称 |
ELECTROSTATIC PROTECTION CIRCUIT |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide an electrostatic protection circuit capable of reducing the size of a circuit area, and protecting the gate oxide films of MOS transistors from electrostatic surge. Ž<P>SOLUTION: The electrostatic protection circuit is used for a semiconductor device which includes a plurality of power source systems separated in power source and to be driven by the same voltage in a normal operation and where a signal is exchanged between the first and second circuits to be operated by the different power source systems. The electrostatic protection circuit includes protecting circuits inserted onto signal lines. The protecting circuits are two serially connected native MOS transistors with negative thresholds. The gates of the two native MOS transistors are respectively connected to the high-potential power sources of the first and second circuits. The gate oxide films are formed to be thicker than the gate films of the MOS transistors constituting the first and second circuits. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
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申请公布号 |
JP2009260082(A) |
申请公布日期 |
2009.11.05 |
申请号 |
JP20080108139 |
申请日期 |
2008.04.17 |
申请人 |
KAWASAKI MICROELECTRONICS INC |
发明人 |
SASAKI SHINGO |
分类号 |
H01L21/822;H01L21/8238;H01L27/04;H01L27/06;H01L27/092 |
主分类号 |
H01L21/822 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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