发明名称 CARRIER HEAD AND SYSTEM FOR CHEMICAL MECHANICAL POLISHING OF SUBSTRATE
摘要 <P>PROBLEM TO BE SOLVED: To improve productive efficiency of a die by reducing excessive local polishing and polishing a large number of substrates on a single polishing pad. <P>SOLUTION: This carrier head 200 to polish the substrate 12 is furnished with: a body 204 having a wall extending downward and to partition a cavity 210; a sleeve 220 provided on a lower end of the wall extending downward; and a member 214 with elasticity to form a pressure chamber in the cavity 210. The member 214 with elasticity has: an inner surface to make contact with fluid in the chamber; a part to make a substrate reception surface to make contact with a back surface of the substrate 12; and a part to make contact with an internal wall of the cavity 210. <P>COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2009255292(A) 申请公布日期 2009.11.05
申请号 JP20090187448 申请日期 2009.08.12
申请人 APPLIED MATERIALS INC 发明人 SHENDON NORM
分类号 B24B37/005;B24B37/07;B24B37/10;H01L21/304 主分类号 B24B37/005
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