| 摘要 |
<p>A pushing unit and test handler having the same is provided to allow loading many semiconductor devices since a multi-carry set and a support bar supporting the multi-carry set. A pushing unit(740) and test handler includes a match plate(750) and a plurality of supporting plates(760) connected to the match plate, and a contact socket set(772), combined in a plurality of supporting plates, composed of a plurality of unit contact sockets(770). The support plate and the match plate are jointed with a pin and an elastic member is installed between the support plate and the match plate.</p> |
