发明名称 Multi-bit phase alignment for synchronization mark pattern matching
摘要 Embodiments of the present invention relate to the detection of synchronization marks in data storage and retrieval. To detect a synchronization mark, embodiments of the present invention require both pattern matching and proper phase alignment, following a repeating synchronization field. According to one particular embodiment, proper phase alignment following a repeated four bit synchronization field, is utilized in conjunction with pattern matching, to identify a synchronization mark. By allowing a synchronization mark to be identified only with proper phase alignment at the earliest possible occurrence of the synchronization mark, accuracy of synchronization mark detection may be improved.
申请公布号 US2009274028(A1) 申请公布日期 2009.11.05
申请号 US20080150814 申请日期 2008.04.30
申请人 GALBRAITH RICHARD LEO;HANSON WELDON MARK;OENNING TRAVIS ROGER;TRUAX TODD CARTER 发明人 GALBRAITH RICHARD LEO;HANSON WELDON MARK;OENNING TRAVIS ROGER;TRUAX TODD CARTER
分类号 G11B20/14 主分类号 G11B20/14
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