发明名称
摘要 There is provided a transistor and a method of manufacturing this transistor that allow a high degree of freedom when designing a wiring structure and also allow an improvement in product quality to be achieved. The transistor includes a source area, a drain area, and a channel area, each of which are formed by semiconductor films, and also a gate insulating film and a gate electrode. The semiconductor film containing the source area and the semiconductor film containing the drain area are formed separately sandwiching both sides of an insulating member. The semiconductor film containing the channel area is formed on top of the insulating member.
申请公布号 JP4356309(B2) 申请公布日期 2009.11.04
申请号 JP20020351112 申请日期 2002.12.03
申请人 发明人
分类号 G02F1/1368;H01L29/786;H01L21/336;H01L21/77;H01L21/84;H01L27/12 主分类号 G02F1/1368
代理机构 代理人
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