发明名称 APPEARANCE INSPECTION SYSTEM
摘要 <P>PROBLEM TO BE SOLVED: To provide an appearance inspection system for obtaining a sufficient precision by image extraction according to the dispersion of the size of the objective inspection region. Ž<P>SOLUTION: The appearance inspecting system using an image processing performs inspection measures the working part of the rotation correction image after performing a rotation correction to the photographed image of the inspection object. Then the objective inspection region is extracted by a pattern matching with the result of the measurement of a good quality image adjusted in the size to the measurement result by binarizing the extracted objective inspection region, the appearance inspection is performed. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
申请公布号 JP2009250880(A) 申请公布日期 2009.10.29
申请号 JP20080101566 申请日期 2008.04.09
申请人 HITACHI CHEM CO LTD 发明人 ISHIDE MUNEKAZU
分类号 G01N21/88;G01B11/24;G06T1/00 主分类号 G01N21/88
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