发明名称 METHOD FOR FORMING SEMICONDUCTOR DEVICE
摘要 <p>PURPOSE: A method for forming a semiconductor device is provided to prevent the deterioration of an element property while maximizing the productivity of a vertical transistor. CONSTITUTION: A method for forming a semiconductor device is comprised of the steps: forming an upper pillar by using a hard mask pattern which is arranged by a certain interval as an etch mask; forming a lower pillar by performing isotropy etching of the semiconductor with a hard mask pattern(42) and the upper pillar(44); forming a gate oxidation film over the semiconductor substrate(40) including the upper and lower pillar; forming the gate electrode over the surface of the gate oxidation film; and forming the insulating layer over the surface of the gate electrode(50).</p>
申请公布号 KR20090112927(A) 申请公布日期 2009.10.29
申请号 KR20080038716 申请日期 2008.04.25
申请人 HYNIX SEMICONDUCTOR INC. 发明人 KIM, JI HYE;KIM, HYUN JUNG
分类号 H01L21/336;H01L29/78 主分类号 H01L21/336
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