发明名称 |
METHOD FOR FORMING SEMICONDUCTOR DEVICE |
摘要 |
<p>PURPOSE: A method for forming a semiconductor device is provided to prevent the deterioration of an element property while maximizing the productivity of a vertical transistor. CONSTITUTION: A method for forming a semiconductor device is comprised of the steps: forming an upper pillar by using a hard mask pattern which is arranged by a certain interval as an etch mask; forming a lower pillar by performing isotropy etching of the semiconductor with a hard mask pattern(42) and the upper pillar(44); forming a gate oxidation film over the semiconductor substrate(40) including the upper and lower pillar; forming the gate electrode over the surface of the gate oxidation film; and forming the insulating layer over the surface of the gate electrode(50).</p> |
申请公布号 |
KR20090112927(A) |
申请公布日期 |
2009.10.29 |
申请号 |
KR20080038716 |
申请日期 |
2008.04.25 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
KIM, JI HYE;KIM, HYUN JUNG |
分类号 |
H01L21/336;H01L29/78 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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