发明名称 POLISHING PAD AND POLISHING METHOD USING THE SAME
摘要 <P>PROBLEM TO BE SOLVED: To provide a polishing pad capable of achieving high speed polishing and excellent in polishing characteristics, and also capable of easily cleaning a polished material after polishing, even when hydrophobic materials such as a silicon wafer and a low dielectric insulating body are polished. <P>SOLUTION: There are provided a polishing pad obtained by cleaning by solvent a polishing pad containing 0.1 to 50 mass% of a water-soluble substance having 1 g/100 g or more solubility into water at 25&deg;C, and a polishing method for polishing a polished material by using the polishing pad. A silicon wafer is preferable as the polished material. <P>COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2009241184(A) 申请公布日期 2009.10.22
申请号 JP20080089277 申请日期 2008.03.31
申请人 KURARAY CO LTD 发明人 KATO MITSURU;KIKUCHI HIROBUMI;TAKAOKA NOBUO;NAKAYAMA KIMIO
分类号 B24B37/24;H01L21/304 主分类号 B24B37/24
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