发明名称 SAMPLE ANALYZER AND SAMPLE ANALYZING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a sample analyzer capable of selecting a proper detection condition by detecting a predetermined component on the basis of a plurality of detection conditions at the time of measurement of one sample to perform precise analysis, and a sample analyzing method. SOLUTION: A measuring sample containing a sample and a reagent is prepared and a predetermined component contained in the prepared measuring sample is detected. Control is performed so as to detect the predetermined component contained in one measuring sample at every detection condition of a plurality of the detection conditions used in the case of detection. The predetermined component is analyzed on the basis of at least one of the detection results under a plurality of the detection conditions. COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2009243977(A) 申请公布日期 2009.10.22
申请号 JP20080088826 申请日期 2008.03.28
申请人 SYSMEX CORP 发明人 NAGAI TAKAAKI
分类号 G01N35/00;G01N33/49 主分类号 G01N35/00
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