| 摘要 |
PROBLEM TO BE SOLVED: To provide a test circuit capable of solving the problem that a correct operation of a ROM is not guaranteed in a real operation state that the ROM is incorporated in a device. SOLUTION: The test circuit is incorporated in a ROM, and a stop address setting register 22 is provided. Test addresses up to an address value set in the stop address setting register 22 are generated by an address generation counter 21 to obtain a checksum. COPYRIGHT: (C)2010,JPO&INPIT
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