发明名称 HEAT TREATMENT APPARATUS, AND TREATMENT SYSTEM
摘要 PROBLEM TO BE SOLVED: To sufficiently suppress metal contamination of a lower surface of a silicon substrate even when a heating temperature of a heat treatment apparatus is made high. SOLUTION: The heat treatment apparatus 4 for heat-treating the silicon substrate W includes a placing table 23 for placing and heating the silicon substrate W thereon, wherein a cover 35 made of any of silicon, silicon carbide, and aluminum nitride is placed on an upper surface of the placing table 23. By covering the upper surface of the placing table 23 by the cover 35 made of silicon or the like, the metal contamination of the lower surface of the silicon substrate W is suppressed. COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2009239056(A) 申请公布日期 2009.10.15
申请号 JP20080083882 申请日期 2008.03.27
申请人 TOKYO ELECTRON LTD 发明人 ONISHI TADASHI;TOZAWA SHIGEKI;MURAKI YUSUKE;NIDO TAKAFUMI
分类号 H01L21/302;H01L21/3065 主分类号 H01L21/302
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