发明名称 Dynamic RAM storage techniques
摘要 Dynamic RAM (DRAM) cells are provided. Data can be read from a DRAM cell without draining the stored charge stored in the cell. During a read cycle, current flows between a Read Bit line and a supply voltage, and charge is not drained directly from the DRAM storage node. Each DRAM cell has a small number of transistors. The DRAM cell can be used to store configuration data on a programmable integrated circuits (IC). Pass gates are used on programmable ICs to drive signals across the chip. Data stored in DRAM cells is provided directly to the pass gates at the full supply voltage to prevent signal degradation. A p-channel transistor eliminates all N-type junctions from the storage node reducing the collection of particles that may cause soft errors.
申请公布号 US7602634(B2) 申请公布日期 2009.10.13
申请号 US20070844916 申请日期 2007.08.24
申请人 发明人 TURNER JOHN
分类号 G11C11/24 主分类号 G11C11/24
代理机构 代理人
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