APPARATUS AND METHOD FOR INSPECTING A DEFECT

摘要

PURPOSE: An apparatus and a method for inspecting a defect are provided to detect a defect through a post processing image, thereby largely improving a defect detecting rate influencing an image. CONSTITUTION: An apparatus for inspecting a defect comprises an image sensing unit, a diffusing plate, an illuminating unit, the first display, an image post processing unit and the second display. The first display is connected to the image sensing unit to display an image obtained from the image sensing unit. The image post processing unit is connected to the first display to post-process the image. The second display is connected to the image post processing unit to display a post processed image.