发明名称 POSITIVE PHOTOSENSITIVE RESIN COMPOSITION, METHOD FOR PRODUCING RESIST PATTERN AND ELECTRONIC COMPONENT
摘要 <P>PROBLEM TO BE SOLVED: To provide a positive photosensitive resin composition which has excellent photosensitive characteristic, can be developed with an aqueous alkali solution, ensures sufficiently small shrinkage upon curing, and forms a resist pattern having excellent adhesion and thermal shock resistance. <P>SOLUTION: The positive photosensitive resin composition comprises (A) a polybasic acid anhydride-modified phenolic resin obtained by reacting phenolic hydroxyl groups of a phenolic resin with a polybasic acid anhydride, (B) a compound which generates an acid under light, (C) a heat crosslinking agent and (D) a solvent. <P>COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2009230124(A) 申请公布日期 2009.10.08
申请号 JP20090035567 申请日期 2009.02.18
申请人 HITACHI CHEM CO LTD 发明人 MATSUTANI HIROSHI;UENO TAKUMI;NICOLAS ALEXANDRE;NANAUMI KEN
分类号 G03F7/023;G03F7/004;G03F7/40 主分类号 G03F7/023
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