发明名称 MASS SPECTROSCOPE
摘要 <P>PROBLEM TO BE SOLVED: To provide a mass spectroscope capable of highly-accurately and efficiently performing mass spectrometry of a material to be measured in a simple structure. Ž<P>SOLUTION: The mass spectroscope includes: a device for mass spectrometry, which has a surface on which a metallic body capable of exciting plasmon through irradiation with a laser beam is formed and attaches the material to be measured to the surface; a photoirradiation means which irradiates the surface of the device for mass spectrometry with a laser beam, thereby ionizing a measurement sample adhering to the surface and desorbing it from the surface; and a detecting means which detects the mass of the measurement sample from time of flight of the measurement sample, desorbed from the surface of the device for mass spectrometry and then ionized, wherein the photoirradiation means has a polarized light-adjusting mechanism which adjusts the polarization direction of a laser beam, thereby solving the problem. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
申请公布号 JP2009231066(A) 申请公布日期 2009.10.08
申请号 JP20080075367 申请日期 2008.03.24
申请人 FUJIFILM CORP 发明人 NAYA MASAYUKI;TOMARU YUICHI;MURAKAMI NAOKI
分类号 H01J49/16;G01N27/62;G01N27/64;H01J49/40 主分类号 H01J49/16
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