| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a display defect evaluation method capable of accurately evaluating a linear defect of a display device. Ž<P>SOLUTION: The linear defect detecting method includes: a taken image acquisition processing (step S1) for acquiring an taken image of a display device; an inspection area setting processing (step S2) for setting a to-be-inspected area on the taken image; a differential processing (step S3) for forming a differential image by removing a high frequency component and a linear defect component from the taken image and subtracting the differential image from the taken image; a smoothing processing (step S4) for removing the high frequency component form the differential processed image; a one-dimensional addition processing (step S5) for adding brightness data of each pixel of the smoothing processed image in the vertical direction and horizontal direction and forming profile data in each direction; a moving average processing (step S6) for performing moving average processing on each profile data; and a defect detection processing (step S7) for determining a differential value of data of each pair of neighboring pixels from the profile data after the moving average processing and detecting a linear defect by extracting a part with a large change by comparing the differential value and a threshold. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
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