发明名称 POLISHING COMPOSITION, AND CHEMICAL MECHANICAL POLISHING METHOD USING THE SAME
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a polishing composition with which a polyimide film on a semiconductor substrate is polished at high speed while damage such as a scratch is suppressed and which achieves high flatness after the polishing, and to provide a chemical mechanical polishing method using the same. <P>SOLUTION: In semiconductor device manufacture, the polishing composition is used for chemical mechanical polishing on a film substrate composed principally of a polyimide film substrate or polyimide, and contains (a) an oxidant and (b) abrasive grains, and preferably contains (c) a PH adjuster. <P>COPYRIGHT: (C)2010,JPO&INPIT</p>
申请公布号 JP2009224695(A) 申请公布日期 2009.10.01
申请号 JP20080069881 申请日期 2008.03.18
申请人 FUJIFILM CORP 发明人 YAMADA TORU
分类号 H01L21/304;B24B37/00;C09K3/14 主分类号 H01L21/304
代理机构 代理人
主权项
地址