发明名称 MASK, LITHOGRAPHIC APPARATUS AND SEMICONDUCTOR COMPONENT
摘要 <P>PROBLEM TO BE SOLVED: To reduce the apodization of a projection optical system pupil, and to decrease the aberration of a projection optical system. <P>SOLUTION: In the mask including a multilayer coating having a specified periodic film thickness distribution used in a lithographic apparatus, the periodic film thickness distribution in a mask plane is selected so as to be larger than the periodic film thickness distribution optimum for obtaining maximum reflectivity. Also, the periodic film thickness distribution is fixed over the entire mask surface. As a result, not only the symmetry of the apodization in a pupil increases, but also an change in intensity is reduced as a whole. <P>COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2009224792(A) 申请公布日期 2009.10.01
申请号 JP20090127256 申请日期 2009.05.27
申请人 CARL ZEISS SMT AG 发明人 MANN HANS-JUERGEN;LOWISCH MARTIN;SINGER WOLFGANG
分类号 H01L21/027;G03F1/22;G03F1/24;G03F7/20 主分类号 H01L21/027
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