发明名称 THERMAL-TYPE INFRARED SOLID-STATE IMAGING DEVICE AND MANUFACTURING METHOD OF THE SAME
摘要 PURPOSE: A thermal-type infrared solid-state imaging device is provided to improve thermal response characteristic of a pixel without deteriorating incident infrared absorbtivity. CONSTITUTION: The thermal-type infrared solid-state imaging device includes the substrate, the infrared detector, and the eaves portion(12). In a substrate, the integrated circuit for deciphering a signal is formed. The infrared detector has the supporting part including a diaphragm, and the wiring at least. The diaphragm includes the temperature detection part. The wiring electrically connects the temperature detection part and integrated circuit of a diaphragm. The eaves portion has the first portion(12a), the second portion(12b), and the third site(12c). The first portion is extended to the outside of a diaphragm. The first portion of the eaves portion is thicker than the thickness of the second portion and the third portion.
申请公布号 KR20090103842(A) 申请公布日期 2009.10.01
申请号 KR20090026628 申请日期 2009.03.27
申请人 发明人
分类号 H01L27/146 主分类号 H01L27/146
代理机构 代理人
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