摘要 |
PURPOSE: A probe needle is provided to prevent damage to a probe part of a probe needle in manufacturing a probe chip by including a push unit. CONSTITUTION: A probe needle(100) includes a probe part(105), a soldering part(101), a beam part(103), and a push unit(107). The probe part is contacted with a pad. The pad is prepared in an object. The soldering part is soldered on a base substrate in order to deliver an electrical signal to the probe part. The beam part connects the probe part to the soldering part. The beam part has an elastic force in order to contact the probe part in the pad. The push unit pushes the soldering part in order to solder the soldering part to the base substrate. |