发明名称 Probe and system for inspecting electrically conductive components
摘要 A pulsed eddy current two-dimensional sensor array probe (12) for electrically conducting component inspection includes a drive coil (16) disposed adjacent to a structure under inspection, a pulse generator (20) connected to the drive coil (16) and operable to energize in a pulsed manner the drive coil (16) to transmit transient electromagnetic flux into the structure under inspection, and an array of sensors (18) arranged in a two-dimensional array and substantially surrounded by the drive coil (16) and operable to sense and generate output signals from the transient electromagnetic flux in the structure under inspection. <IMAGE>
申请公布号 PL203364(B1) 申请公布日期 2009.09.30
申请号 PL20020354416 申请日期 2002.06.11
申请人 GENERAL ELECTRIC COMPANY 发明人 PLOTNIKOV YURI ALEXEYEVICH;NATH SHRIDHAR CHAMPAKNATH;ROSE CURTIS WAYNE;BATZINGER THOMAS JAMES;HERD KENNETH GORDON
分类号 G01N27/90;G01N27/87 主分类号 G01N27/90
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